Modulated Degradation of Transient Electronic Devices through Multilayer Silk Fibroin Pockets
본문
Mark A. Brenckle, Huanyu Cheng, Suk-Won Hwang, Hu Tao, Mark Paquette, David L. Kaplan, John A. Rogers, Yonggang Huang, Fiorenzo G. Omenetto
"Modulated Degradation of Transient Electronic Devices through Multilayer Silk Fibroin Pockets",
ACS Applied Materias and Interfaces 7, 19870-19875 (2015)
"Modulated Degradation of Transient Electronic Devices through Multilayer Silk Fibroin Pockets",
ACS Applied Materias and Interfaces 7, 19870-19875 (2015)